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Bruker Nano GmbH, Berlin, Germany

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Name

Bruker Nano GmbH
Bruker AXS Microanalysis GmbH
RÖNTEC AG
Röntec Holding AG

Register

Ut
District Court of Charlottenburg (Berlin) HRB 99662 B
Ut
District Court of Charlottenburg (Berlin) HRB 72789 B
Sirul
Siren 529099046
Sirul
Siret 52909904600011

Address

Am Studio 2 d, 12489 Berlin, Germany

Corporate purpose

The development, production and distribution of equipment and processes for the analysis of a wide range of materials in terms of their composition and microstructure, as well as surface measurement and sensor systems, including their application in industry, research and teaching.

Additional info

26.51
Manufacture of instruments and appliances for measuring, testing and navigation

Financials

Employees

Employees

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History

Legal Representatives

Marketing & Tech

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Publications

19 Jun 2024
Patent: Kikuchi Diffraction Detector
9 Apr 2024
Annual report for the year ending 31/12/2020 · Balance sheet for 31/12/2020 · Earnings statement for 31/12/2020
11 Mar 2024
Wordmark: “DynAsyst“
Year 2024 in Fts
4 EU fundings (total €2,515.44): Provisional Budgetary Commitment Covering Routine Administrative Expenditure or Expenditure Referred to in Art. 170 FR …
3 Jan 2024
Patent: Method for Obtaining Stereoscopic Image Information
27 Sept 2023
Annual report for the year ending 31/12/2019 · Balance sheet for 31/12/2019 · Earnings statement for 31/12/2019
29 Aug 2023
Annual report for the year ending 31/12/2019 · Balance sheet for 31/12/2019 · Earnings statement for 31/12/2019
23 Aug 2023
Patent: Method of Processing an EDX/XRF MAP and a Corresponding Image Processing Device
26 Jul 2023
Patent: Detector, Methods for Operating a Detector and Detector Pixel Circuit
1 Jun 2023 as Bruker AXS Microanalysis GmbH in France
Segment clas­si­fi­ca­tion
28 Feb 2023
No longer Officer (2)
31 Oct 2022
Annual report for the year ending 31/12/2018 · Balance sheet for 31/12/2018 · Earnings statement for 31/12/2018
26 Oct 2022
Patent: Multi-Module Photon Detector and USE Thereof
26 Jul 2022
Patent: Detector and Method for Obtaining Kikuchi Images
19 Jul 2022
Wordmark: “PeakForce-QI“
5 Jul 2022
Annual report for the year ending 31/12/2018 · Balance sheet for 31/12/2018 · Earnings statement for 31/12/2018
22 Jun 2022
Patent: Method for processing an EDX/XRF card and associated image processing device
21 Mar 2022
Patent: Method for Determining an Element Concentration of an EDS/WDS Spectrum of an Unknown Sample and a Corresponding Device
26 Jan 2022
Officer (3) · No longer Officer (2)
5 Nov 2021
Annual report for the year ending 31/12/2017 · Balance sheet for 31/12/2017 · Earnings statement for 31/12/2017
Year 2021 in Epobase
5 European patent filings: Method for Improving Kikuchi Diffraction Patterns …
16 Jun 2021
Patent: Methods for improving Kikuchi diffraction patterns
27 May 2021
Patent: Measuring device for a scanning probe microscope and method for scanning probe microscopic examination of a measurement sample with a scanning probe microscope
27 Jan 2021
Patent: Detector of Kikuchi diffraction
Year 2020 in Dp
5 patent filings: Arrangement with a measuring device for a scanning probe microscope, scanning probe microscope and operating method …
1 Jul 2020
Wordmark: “NanoRacer“
25 Mar 2020
Patent: Method and System for Determining the Position of a Radiation Source
Year 2019 in Epobase
9 European patent filings: Method for Improving Kikuchi Diffraction Patterns …
15 Oct 2019
Officer (2) · Share­holder agreement · Corporate Purpose
30 Sept 2019
Original document: “Gesellschaftsvertrag / Satzung / Statut“
1 Jul 2019
Annual report for the year ending 31/12/2017 · Balance sheet for 31/12/2017 · Earnings statement for 31/12/2017
6 Jun 2019
Patent: Measuring device for a scanning probe microscope, scanning probe microscope and method for scanning probe microscopy determination of one or more measuring samples with a scanning probe …
8 May 2019
Patent: X-ray fluorescence spectrometer
27 Dec 2018
Annual report for the year ending 31/12/2016 · Balance sheet for 31/12/2016 · Earnings statement for 31/12/2016
21 Dec 2018 in Fts
EU funding (€97,595): Purchase of Ebsd Detector for FIB
1 Dec 2018 as Bruker AXS Microanalysis GmbH
Wordmark: “NANOS“
Year 2018 in Epobase
4 European patent filings: Moveable Detector …
1 Oct 2018 in Fk
Public funding (€48,112): Standardization of total reflection X-ray fluorescence analysis by novel nanoscale calibration samples
5 Sept 2018 via JPKinstruments AG
Ter­mi­na­tion · Merger: Bruker Nano GmbH
5 Sept 2018
Merger: JPKinstruments AG
4 Sept 2018 as Bruker AXS Microanalysis GmbH in France
Name: BRUKER AXS MICROANALYSIS GMBH
27 Aug 2018
Original document: “Unternehmensvertrag / Umwandlungsvertrag / sonstiger Vertrag“
1 Jul 2018 via JPK Instruments AG
Word figurative mark
30 Apr 2018
Annual report for the year ending 31/12/2016 · Balance sheet for 31/12/2016 · Earnings statement for 31/12/2016
10 Jan 2018
Patent: Procedure and system for determining the position of a radiation source
17 Aug 2017
Wordmark: “S4 T-STAR“
7 Mar 2017
Annual report for the year ending 31/12/2015 · Balance sheet for 31/12/2015 · Earnings statement for 31/12/2015
15 Dec 2016
Original document: “Liste der Gesellschafter“
Year 2016 in Epobase
6 European patent filings: Method and Arrangement for Generating Representations of Anisotropic Properties and a Corresponding Computer Program and a Corresponding Computer-Readable Storage Medium …
26 Sept 2016 via JPK Instruments AG
EU funding: Regulated Assembly of Molecular Machines for DNA REPAIR: a Molecular Analysis training Network
15 Jul 2016
Wordmark: “TStar“
1 Apr 2016
Annual report for the year ending 31/12/2014 · Balance sheet for 31/12/2014 · Earnings statement for 31/12/2014
18 Feb 2016
Patent: Method for scanning a sample by means of x-ray optics and an apparatus for scanning a sample
18 Feb 2016
Patent: Method for scanning a sample using X-ray optics and an apparatus for scanning a sample
1 Jan 2016 in Fts
EU funding (€737.23): Consumables and Repairs Related Expenses
1 Jan 2016 in Fts
EU funding (€437.67): Consumables and Repairs Related Expenses Unit
Year 2015 in Dp
5 patent filings: Method and arrangement for the identification of crystalline phases as well as a corresponding computer program and a corresponding computer-readable storage medium …
27 Aug 2015
No longer Managing Director: Bernard J. Kolodziej
20 Mar 2015
Annual report for the year ending 31/12/2013 · Balance sheet for 31/12/2013 · Earnings statement for 31/12/2013
1 Jan 2015 in Fts
EU funding (€425.17): Decommissioning and Waste Management (Consumables and Fees)
1 Jan 2015 in Hor
EU funding (€3,911,897): Biochemical and mechanochemical mechanisms in polarized cells
Year 2014 in Dp
7 patent filings: Method for the detection of X-rays as well as a device …
18 Jun 2014 via JPK Instruments AG
Patent: Device for Receiving a Test Sample
21 May 2014 in Fts
EU funding (€94,800): Supply X-ray Fluorescence Spectrometer-Txrf
24 Feb 2014
Annual report for the year ending 31/12/2012 · Balance sheet for 31/12/2012 · Earnings statement for 31/12/2012
3 Jan 2014
No longer Control: Bruker Elemental GmbH
1 Jan 2014 in Fts
EU funding (€915.37): Provisional Budgetary Commitment Covering Routine Administrative Expenditure or Expenditure Referred to in Art. 170 FR
26 Sept 2013
Patent: Material testing procedure and arrangement for material testing
10 Jun 2013
Address
15 May 2013
Patent: X-RAY Detectors Comprising LOW Stray Field Magnetic Traps
27 Mar 2013
Patent: Detector, Device, and Method for the Simultaneous, Energy-Dispersive Recording of Backscattered Electrons and X-RAY Quanta
6 Dec 2012
Annual report for the year ending 31/12/2011 · Balance sheet for 31/12/2011 · Earnings statement for 31/12/2011
7 Sept 2012
No longer Officer (2)
29 Aug 2012
Patent: Sensor Head for an X-RAY Detector and X-RAY Detector Containing Said Sensor Head
9 Jan 2012
Annual report for the year ending 31/12/2010 · Balance sheet for 31/12/2010 · Earnings statement for 31/12/2010
1 Nov 2011 via JPK Instruments AG
Wordmark: “Scanvergnügen“
25 Mar 2011 via BRUKER AXS AG, also 26/11/2009, 30/03/2009, 19/02/2008, 03/05/2007
Shareholder: BRUKER AXS GmbH
18 Mar 2011
Annual report for the year ending 31/12/2009 · Balance sheet for 31/12/2009 · Earnings statement for 31/12/2009
3 Mar 2011
Patent: Device for feeding and positioning a teller-shaped holder for at least one sample
3 Mar 2011
Patent: Method and arrangement for generating representations of anisotropic properties as well as a corresponding computer program and a corresponding computer-readable storage medium
27 Jan 2011
Patent: Procedure and arrangement for generating representations of anisotropic properties as well as a corresponding computer program and a corresponding computer-readable storage medium
Year 2010 in Dp
4 patent filings: Low-interference sensor head for a radiation detector and radiation detector containing this low-interference sensor head …
19 Nov 2010
The entry for the business address is supplemented ex officio in accordance with § 3 EGGmb-HG: Business address ...
1 Sept 2010 as JPK Instruments AG in France
Reg­is­tra­tion: 01/09/2010 · Address · Legal form: Société étrangère non immatriculée au RCS · Name: JPK INSTRUMENTS AG · Segment clas­si­fi­ca­tion
13 Apr 2010
Annual report for the year ending 31/12/2008 · Balance sheet for 31/12/2008 · Earnings statement for 31/12/2008
11 Feb 2010
Name: Bruker Nano GmbH · Corporate Purpose
Year 2009 in Dp
9 patent filings: Method and device for determining the cell activation of a target cell by an activator …
9 Jun 2009 as Bruker AXS Microanalysis GmbH
Merger: Bruker Nano GmbH
28 May 2009 via Bruker Nano GmbH
Merger: Bruker Nano GmbH
4 May 2009 as Bruker AXS Microanalysis GmbH
Officer (3) · Merger: Bruker Nano GmbH · Capital: €330,000
1 Apr 2009 via JPK Instruments AG
Patent: Method for Locally Highly Resolved, Mass-Spectroscopic Characterisation of Surfaces Using Scanning Probe Technology
11 Feb 2009 via JPK Instruments AG
Patent: Method and Device for Positioning a Movable Part in a Test System
14 Jan 2009 via JPK Instruments AG
Patent: Device and Method for Scanning Probe Microscope
Year 2008 in Dp
5 patent filings: Method and device for characterizing a sample with two or more optical traps …
14 Oct 2008 as Bruker AXS Microanalysis GmbH
Annual report for the year ending 31/12/2007 · Balance sheet for 31/12/2007 · Earnings statement for 31/12/2007
10 Oct 2008 as Bruker AXS Microanalysis GmbH
Control: Bruker-Quantron GmbH
1 Oct 2008 as Bruker AXS Microanalysis GmbH
Control: Bruker-Quantron GmbH
Year 2008 in Epobase
5 European patent filings: Method and Apparatus for the Combined Analysis of a Sample with Objects to BE Analysed …
31 Oct 2007 via JPK Instruments AG
Patent: Method and Device for Analysing a Sample by Means of a Raster Scanning Probe Microscope
20 Aug 2007 via JPK Instruments AG
Patent: Apparatus and a Method for Examining a Specimen with a Probe Microscope
27 Jul 2007 via JPK Instruments AG
Patent: Device and Method for a Probe Microscopic Examination of a Sample
25 Jul 2007 as Bruker AXS Microanalysis GmbH
Annual report for the year ending 31/12/2006 · Balance sheet for 31/12/2006 · Earnings statement for 31/12/2006
12 Jul 2007
Patent: Method for operating a measuring system with a scanning probe microscope and measuring system
5 Apr 2007
Patent: Method and device for positioning a removable component in an examination system
4 Dec 2006
Officer: Gabriele Seifert
19 Sept 2006 via JPK Instruments AG
Patent: Method for Operating a Measuring Arrangement Having a Scanning Probe Microscope Device and a Measuring Arrangement
30 Jun 2006 via JPK Instruments AG
Patent: Method for Examining a Measurement Object, and Apparatus
9 Feb 2006
Patent: Device for taking a sample
20 Dec 2005 as Bruker AXS Microanalysis GmbH
MD: Bernard J. Kolodziej, Thomas Schülein · Change of legal form: RÖNTEC AG · Capital: €300,000 · Share­holder agreement · Seat: Berlin, Germany · Legal form: GmbH · Proxy · Corporate Purpose
20 Dec 2005 as RÖNTEC AG
Change of legal form: Bruker AXS Microanalysis GmbH · Capital: €300,000
2 Sept 2005
Wordmark: “ForceRobot“
12 Aug 2005
Partial control: Mobility AG Venture Capital GmbH, bmp Venture Tech GmbH
20 Apr 2005
Capital: €3,064,968 · Company statute
11 Apr 2005 as RÖNTEC AG
Partial control: Ventegis Capital AG, bmp Venture Tech GmbH · Merger · Capital: €3,064,968 · Name: RÖNTEC AG · Corporate Purpose
5 Aug 2004 as Röntec Holding AG
Reg­is­tra­tion · CxO: Thomas Schülein · PPA: Gabriele Seifert · Change of legal form: RÖNTEC Holding GmbH · Capital: €3,072,631 · Seat: Berlin, Germany · Legal form: AG · Name: Röntec Holding AG …

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